Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements / Gomeniuk, Yu. V. (2012)
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web address of the page http://jnas.nbuv.gov.ua/article/UJRN-0000350277
  Semiconductor Physics, Quantum Electronics and Optoelectronics        А - 2019  /     Issue (2012, Vol. 15, № 1)

Gomeniuk Yu. V.
Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements

Cite:
Gomeniuk, Yu. V. (2012). Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements. Semiconductor Physics, Quantum Electronics and Optoelectronics , 15 (1), 1-7. http://jnas.nbuv.gov.ua/article/UJRN-0000350277

 

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