Metrological aspects of studying the specific contact resistivity of ohmic contacts by using the four-contact method / Sheremet, V. N. (2014)
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web address of the page http://jnas.nbuv.gov.ua/article/UJRN-0000353052
  Semiconductor Physics, Quantum Electronics and Optoelectronics        А - 2019  /     Issue (2014, Vol. 17, № 4)

Sheremet V. N.
Metrological aspects of studying the specific contact resistivity of ohmic contacts by using the four-contact method

Cite:
Sheremet, V. N. (2014). Metrological aspects of studying the specific contact resistivity of ohmic contacts by using the four-contact method. Semiconductor Physics, Quantum Electronics and Optoelectronics , 17 (4), 394-397. http://jnas.nbuv.gov.ua/article/UJRN-0000353052

 

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