Microstructure of thin Si−Sn composite films / Neimash, V. B., Poroshin, V. M., Kabaldin, A. M., Yukhymchuk, V. O., Shepelyavyi, P. E., Makara, V. A., Larkin, S. Yu. (2013)
web address of the page http://jnas.nbuv.gov.ua/article/UJRN-0000690935
Ukrainian journal of physics   А - 2018 /  Issue (2013, Vol. 58, № 9)
Neimash V. B., Poroshin V. M., Kabaldin A. M., Yukhymchuk V. O., Shepelyavyi P. E., Makara V. A., Larkin S. Yu.
Microstructure of thin Si−Sn composite films
Cite:
Neimash, V. B., Poroshin, V. M., Kabaldin, A. M., Yukhymchuk, V. O., Shepelyavyi, P. E., Makara, V. A., Larkin, S. Yu. (2013). Microstructure of thin Si−Sn composite films. Ukrainian journal of physics, 58 (9), 865-871. http://jnas.nbuv.gov.ua/article/UJRN-0000690935 | |
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