Influence of SiOx-film deposited by thermal evaporation on the near-bandedge luminescence of mono-crystalline silicon / Vlasenko, N. A., Sopinskij, N. V., Gule, E. G., Veligura, L. I., Bratus, V. Ja., Melnik, R. S., Denisova, Z. L., Mukhlo, M. A. (2010)
Ukrainian

English  Optoelectronics and Semiconductor Technique   /     Issue (2010, 45)

Vlasenko N. A., Sopinskij N. V., Gule E. G., Veligura L. I., Bratus V. Ja., Melnik R. S., Denisova Z. L., Mukhlo M. A.
Influence of SiOx-film deposited by thermal evaporation on the near-bandedge luminescence of mono-crystalline silicon


Cite:
Vlasenko, N. A., Sopinskij, N. V., Gule, E. G., Veligura, L. I., Bratus, V. Ja., Melnik, R. S., Denisova, Z. L., Mukhlo, M. A. (2010). Influence of SiOx-film deposited by thermal evaporation on the near-bandedge luminescence of mono-crystalline silicon. Optoelectronics and Semiconductor Technique, 45, 76-82. http://jnas.nbuv.gov.ua/article/UJRN-0000363613 [In Russian].

 

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