Cause of instability of laser oscillation detected in ZnS:Cr waveguide thin-film electroluminescent structure / Vlasenko, N. A., Oleksenko, P. F., Mukhlo, M. A., Litvin, P. M., Veligura, L. I., Denisova, Z. L. (2011)
Ukrainian

English  Optoelectronics and Semiconductor Technique   /     Issue (2011, 46)

Vlasenko N. A., Oleksenko P. F., Mukhlo M. A., Litvin P. M., Veligura L. I., Denisova Z. L.
Cause of instability of laser oscillation detected in ZnS:Cr waveguide thin-film electroluminescent structure


Cite:
Vlasenko, N. A., Oleksenko, P. F., Mukhlo, M. A., Litvin, P. M., Veligura, L. I., Denisova, Z. L. (2011). Cause of instability of laser oscillation detected in ZnS:Cr waveguide thin-film electroluminescent structure. Optoelectronics and Semiconductor Technique, 46, 28-34. http://jnas.nbuv.gov.ua/article/UJRN-0000363680 [In Russian].

 

Institute of Information Technologies of VNLU


+38 (044) 525-36-24
Ukraine, 03039, Kyiv, Holosiivskyi Ave, 3, room 209