Influence of Sublayers of Germanium on a Threshold of Percolation of a Current in Thin Films of Copper / Bihun, R. I., Buchkovska, M. D., Koltun, N. S., Stasiuk, Z. V., Leonov, D. S. (2013)
Ukrainian

English  Metallophysics and advanced technologies   /     Issue (2013, 35 (1))

Bihun R. I., Buchkovska M. D., Koltun N. S., Stasiuk Z. V., Leonov D. S.
Influence of Sublayers of Germanium on a Threshold of Percolation of a Current in Thin Films of Copper


Cite:
Bihun, R. I., Buchkovska, M. D., Koltun, N. S., Stasiuk, Z. V., Leonov, D. S. (2013). Influence of Sublayers of Germanium on a Threshold of Percolation of a Current in Thin Films of Copper. Metallophysics and advanced technologies, 35 (1), 85-93. http://jnas.nbuv.gov.ua/article/UJRN-0000470889 [In Ukrainian].

 

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