Investigation of composition and structure of films based on Si-Ge alloys by nuclear-physical methods of analysis on proton beams / Levenets, V. V., Shchur, A. A., Shirokov, B. M. (2010)
Ukrainian

web address of the page http://jnas.nbuv.gov.ua/article/UJRN-0000877905
  Physical surface engineering   /     Issue (2010, Т. 8, № 2)

Левенец В. В., Щур А. А., Широков Б. М.
Исследование состава и структуры пленок на основе Si-Ge сплавов ядерно-физическими методами анализа на пучках протонов

Бібліографічний опис:
Левенец В. В., Щур А. А., Широков Б. М. Исследование состава и структуры пленок на основе Si-Ge сплавов ядерно-физическими методами анализа на пучках протонов. Фізична інженерія поверхні. 2010. Т. 8, № 2. С. 130-137. URL: http://jnas.nbuv.gov.ua/article/UJRN-0000877905

English  Physical surface engineering   /     Issue (2010, 8 (2))

Levenets V. V., Shchur A. A., Shirokov B. M.
Investigation of composition and structure of films based on Si-Ge alloys by nuclear-physical methods of analysis on proton beams

Cite:
Levenets, V. V., Shchur, A. A., Shirokov, B. M. (2010). Investigation of composition and structure of films based on Si-Ge alloys by nuclear-physical methods of analysis on proton beams. Physical surface engineering, 8 (2), 130-137. http://jnas.nbuv.gov.ua/article/UJRN-0000877905 [In Russian].

 

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