Deformation-induced effects in indium antimonide microstructures at cryogenic temperatures for sensor applications / Druzhinin, A. O., Khoverko, Yu. M., Ostrovskii, I. P., Liakh-Kaguy, N. S., Pasynkova, O. A. (2019)
web address of the page http://jnas.nbuv.gov.ua/article/UJRN-0001034087
Technology and design in electronic equipment  Б - 2020 /  Issue (2019, № 3-4)
Druzhinin A. O., Khoverko Yu. M., Ostrovskii I. P., Liakh-Kaguy N. S., Pasynkova O. A.
Deformation-induced effects in indium antimonide microstructures at cryogenic temperatures for sensor applications
Cite:
Druzhinin, A. O., Khoverko, Yu. M., Ostrovskii, I. P., Liakh-Kaguy, N. S., Pasynkova, O. A. (2019). Deformation-induced effects in indium antimonide microstructures at cryogenic temperatures for sensor applications. Technology and design in electronic equipment, 3-4, 3-9. http://jnas.nbuv.gov.ua/article/UJRN-0001034087 | |
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