Ellipsometric and spectrometric studies of (Ga0.2In0.8)2Se3 thin film / Studenyak, I. P., Kranjčec, M., Izai, V. Yu., Studenyak, V. I., Pop, M. M., Suslikov, L. M. (2020)
web address of the page http://jnas.nbuv.gov.ua/article/UJRN-0001127978 Ukrainian Journal of Physics А - 2018 / Issue (2020, Т. 65, № 3)
Studenyak I. P., Kranjčec M., Izai V. Yu., Studenyak V. I., Pop M. M., Suslikov L. M. Ellipsometric and spectrometric studies of (Ga0.2In0.8)2Se3 thin film
Cite: Studenyak, I. P., Kranjčec, M., Izai, V. Yu., Studenyak, V. I., Pop, M. M., Suslikov, L. M. (2020). Ellipsometric and spectrometric studies of (Ga0.2In0.8)2Se3 thin film. Ukrainian Journal of Physics, 65 (3), 229-233. http://jnas.nbuv.gov.ua/article/UJRN-0001127978 |
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