Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry / Al-Adamat, K. M., El-Nasser, H. M. (2021)
UkrainianEnglish

web address of the page http://jnas.nbuv.gov.ua/article/UJRN-0001276409
  Ukrainian journal of physics      А - 2018  /     Issue (2021, Vol. 66, № 7)

Al-Adamat K. M., El-Nasser H. M.
Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry

Cite:
Al-Adamat, K. M., El-Nasser, H. M. (2021). Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry. Ukrainian journal of physics, 66 (7), 562-569. http://jnas.nbuv.gov.ua/article/UJRN-0001276409

 

Institute of Information Technologies of VNLU

+38 (044) 525-36-24
libnas@nbuv.gov.ua
Ukraine, 03039, Kyiv, Holosiivskyi Ave, 3, room 209