Raman spectroscopy and X-ray diffraction studies of (GeS2)100-x(SbSI)x glasses and composites on their basis / Rubish V. M., Stefanovich V. O., Maryan V. M., Mykaylo O. A., Shtets P. P., Kaynts D. I., Yurkin I. M. (2014)
інтернет-адреса сторінки: http://jnas.nbuv.gov.ua/article/UJRN-0000352575
Semiconductor physics, quantum electronics & optoelectronics    А - 2019 /  Випуск (2014, Vol. 17, № 1)
Rubish V. M., Stefanovich V. O., Maryan V. M., Mykaylo O. A., Shtets P. P., Kaynts D. I., Yurkin I. M.
Raman spectroscopy and X-ray diffraction studies of (GeS2)100-x(SbSI)x glasses and composites on their basis
Cite:
Rubish, V. M., Stefanovich, V. O., Maryan, V. M., Mykaylo, O. A., Shtets, P. P., Kaynts, D. I., Yurkin, I. M. (2014). Raman spectroscopy and X-ray diffraction studies of (GeS2)100-x(SbSI)x glasses and composites on their basis. Semiconductor Physics, Quantum Electronics and Optoelectronics , 17 (1), 61-66. http://jnas.nbuv.gov.ua/article/UJRN-0000352575 | |
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