Effect of electron-beam treatment of sensor glass substrates for SPR devices on their metrological characteristics / Vashchenko V. A., Yatsenko I. V., Kovalenko Yu. I., Kladko V. P., Gudymenko O. Yo., Lytvyn P. M., Korchovyi A. A., Mamykin S. V., Kondratenko O. S., Maslov V. P., Dorozinska H. V., Dorozinsky G. V. (2019)
інтернет-адреса сторінки: http://jnas.nbuv.gov.ua/article/UJRN-0001073945
Semiconductor physics, quantum electronics & optoelectronics    А - 2019 /  Випуск (2019, Vol. 22, № 4)
Vashchenko V. A., Yatsenko I. V., Kovalenko Yu. I., Kladko V. P., Gudymenko O. Yo., Lytvyn P. M., Korchovyi A. A., Mamykin S. V., Kondratenko O. S., Maslov V. P., Dorozinska H. V., Dorozinsky G. V.
Effect of electron-beam treatment of sensor glass substrates for SPR devices on their metrological characteristics
Cite:
Vashchenko, V. A., Yatsenko, I. V., Kovalenko, Yu. I., Kladko, V. P., Gudymenko, O. Yo., Lytvyn, P. M., Korchovyi, A. A., Mamykin, S. V., Kondratenko, O. S., Maslov, V. P., Dorozinska, H. V., Dorozinsky, G. V. (2019). Effect of electron-beam treatment of sensor glass substrates for SPR devices on their metrological characteristics. Semiconductor Physics, Quantum Electronics and Optoelectronics , 22 (4), 444-451. http://jnas.nbuv.gov.ua/article/UJRN-0001073945 | |
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