Surface defects determining by the wave front scanner / Goloborodko, N. S., Grygoruk, V. I., Kurashov, V. N., Podanchuk, D. V., Goloborodko, A. A., Kotov, M. M. (2010)
web address of the page http://jnas.nbuv.gov.ua/article/UJRN-0000349127
Semiconductor Physics, Quantum Electronics and Optoelectronics    А - 2019 /  Issue (2010, Vol. 13, № 1)
Goloborodko N. S., Grygoruk V. I., Kurashov V. N., Podanchuk D. V., Goloborodko A. A., Kotov M. M.
Surface defects determining by the wave front scanner
Cite:
Goloborodko, N. S., Grygoruk, V. I., Kurashov, V. N., Podanchuk, D. V., Goloborodko, A. A., Kotov, M. M. (2010). Surface defects determining by the wave front scanner. Semiconductor Physics, Quantum Electronics and Optoelectronics , 13 (1), 65-69. http://jnas.nbuv.gov.ua/article/UJRN-0000349127 | |
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