Electrophysical characteristics of near-surface layers in p-Si crystals with sputtered Al films and subjected to elastic deformation / Pavlyk, B. V., Kushlyk, M. O., Didyk, R. I., Shykorjak, Y. A., Slobodzyan, D. P., Kulyk, B. Y. (2013)
web address of the page http://jnas.nbuv.gov.ua/article/UJRN-0000690899
Ukrainian journal of physics   А - 2018 /  Issue (2013, Vol. 58, № 8)
Pavlyk B. V., Kushlyk M. O., Didyk R. I., Shykorjak Y. A., Slobodzyan D. P., Kulyk B. Y.
Electrophysical characteristics of near-surface layers in p-Si crystals with sputtered Al films and subjected to elastic deformation
Cite:
Pavlyk, B. V., Kushlyk, M. O., Didyk, R. I., Shykorjak, Y. A., Slobodzyan, D. P., Kulyk, B. Y. (2013). Electrophysical characteristics of near-surface layers in p-Si crystals with sputtered Al films and subjected to elastic deformation. Ukrainian journal of physics, 58 (8), 742-747. http://jnas.nbuv.gov.ua/article/UJRN-0000690899 | |
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