Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors / Slipokurov, V. S., Dub, M. N., Tkachenko, A. K., Kudryk, Ya. Ya. (2015)
web address of the page http://jnas.nbuv.gov.ua/article/UJRN-0000706499
Semiconductor Physics, Quantum Electronics and Optoelectronics    А - 2019 /  Issue (2015, Vol. 18, № 2)
Slipokurov V. S., Dub M. N., Tkachenko A. K., Kudryk Ya. Ya.
Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors
Cite:
Slipokurov, V. S., Dub, M. N., Tkachenko, A. K., Kudryk, Ya. Ya. (2015). Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors. Semiconductor Physics, Quantum Electronics and Optoelectronics , 18 (2), 144-146. http://jnas.nbuv.gov.ua/article/UJRN-0000706499 | |
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