Analysis of the fundamental absorption edge of the films obtained from the C60 fullerene molecular beam in vacuum and effect of internal mechanical stresses on it / Kolyadina, E. Yu., Matveeva, L. A., Neluba, P. L., Venger, E. F. (2015)
web address of the page http://jnas.nbuv.gov.ua/article/UJRN-0000714287
Semiconductor Physics, Quantum Electronics and Optoelectronics    А - 2019 /  Issue (2015, Vol. 18, № 3)
Kolyadina E. Yu., Matveeva L. A., Neluba P. L., Venger E. F.
Analysis of the fundamental absorption edge of the films obtained from the C60 fullerene molecular beam in vacuum and effect of internal mechanical stresses on it
Cite:
Kolyadina, E. Yu., Matveeva, L. A., Neluba, P. L., Venger, E. F. (2015). Analysis of the fundamental absorption edge of the films obtained from the C60 fullerene molecular beam in vacuum and effect of internal mechanical stresses on it. Semiconductor Physics, Quantum Electronics and Optoelectronics , 18 (3), 349-353. http://jnas.nbuv.gov.ua/article/UJRN-0000714287 | |
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