Characterization of grain boundaries in CdTe polycrystalline films / Tetyorkin, V. V., Sukach, A. V., Boiko, V. A., Tkachuk, A. I. (2015)
web address of the page http://jnas.nbuv.gov.ua/article/UJRN-0000714335
Semiconductor Physics, Quantum Electronics and Optoelectronics    А - 2019 /  Issue (2015, Vol. 18, № 4)
Tetyorkin V. V., Sukach A. V., Boiko V. A., Tkachuk A. I.
Characterization of grain boundaries in CdTe polycrystalline films
Cite:
Tetyorkin, V. V., Sukach, A. V., Boiko, V. A., Tkachuk, A. I. (2015). Characterization of grain boundaries in CdTe polycrystalline films. Semiconductor Physics, Quantum Electronics and Optoelectronics , 18 (4), 428-432. http://jnas.nbuv.gov.ua/article/UJRN-0000714335 | |
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