Effect of tin on structural transformations in the thin-film silicon suboxide matrix / Voitovych, V. V., Rudenko, R. M., Yuchymchuk, V. O., Voitovych, M. V., Krasko, M. M., Kolosiuk, A. G., Povarchuk, V. Yu., Khachevich, I. M., Rudenko, M. P. (2016)
web address of the page http://jnas.nbuv.gov.ua/article/UJRN-0000723819
Ukrainian journal of physics   А - 2018 /  Issue (2016, Vol. 61, № 11)
Voitovych V. V., Rudenko R. M., Yuchymchuk V. O., Voitovych M. V., Krasko M. M., Kolosiuk A. G., Povarchuk V. Yu., Khachevich I. M., Rudenko M. P.
Effect of tin on structural transformations in the thin-film silicon suboxide matrix
Cite:
Voitovych, V. V., Rudenko, R. M., Yuchymchuk, V. O., Voitovych, M. V., Krasko, M. M., Kolosiuk, A. G., Povarchuk, V. Yu., Khachevich, I. M., Rudenko, M. P. (2016). Effect of tin on structural transformations in the thin-film silicon suboxide matrix. Ukrainian journal of physics, 61 (11), 980-986. http://jnas.nbuv.gov.ua/article/UJRN-0000723819 | |
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