Features of X-ray photoelectron spectroscopy for determining the thickness of ultrathin films / Stervoedov, A. N., Beresnev, V. M., Sergeeva, N. V. (2010)
| Physical surface engineering / Issue (2010, 8 (1))
Stervoedov A. N., Beresnev V. M., Sergeeva N. V. Features of X-ray photoelectron spectroscopy for determining the thickness of ultrathin films
Cite: Stervoedov, A. N., Beresnev, V. M., Sergeeva, N. V. (2010). Features of X-ray photoelectron spectroscopy for determining the thickness of ultrathin films. Physical surface engineering, 8 (1), 88-92. http://jnas.nbuv.gov.ua/article/UJRN-0000877899 [In Russian]. |
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