Pseudo-ring tests resolution for dynamic single faults in word-oriented memory / Gritcov, S. S., Sorokin, G. F., Shestacova, T. V. (2018)
web address of the page http://jnas.nbuv.gov.ua/article/UJRN-0000952630
Technology and design in electronic equipment  Б - 2020 /  Issue (2018, № 5-6)
Gritcov S. S., Sorokin G. F., Shestacova T. V.
Pseudo-ring tests resolution for dynamic single faults in word-oriented memory
Cite:
Gritcov, S. S., Sorokin, G. F., Shestacova, T. V. (2018). Pseudo-ring tests resolution for dynamic single faults in word-oriented memory. Technology and design in electronic equipment, 5-6, 3-9. http://jnas.nbuv.gov.ua/article/UJRN-0000952630 | |
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