Concentration maxima of the mobility of 2D electrons scattered by correlated impurity ions in thin doped layers / Mikheev, V. M. (2019)
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English  Low Temperature Physics   /     Issue (2019, 45 (1))

Mikheev V. M.
Concentration maxima of the mobility of 2D electrons scattered by correlated impurity ions in thin doped layers


Cite:
Mikheev, V. M. (2019). Concentration maxima of the mobility of 2D electrons scattered by correlated impurity ions in thin doped layers. Low Temperature Physics, 45 (1), 140-145. http://jnas.nbuv.gov.ua/article/UJRN-0000969471 [In Russian].

 

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