Non-destructive control and diagnostics of led GaN structures by using microplasmas (Review) / Veleshchuk, V. P., Vlasenko, O. I., Vlasenko, Z. K., Khmil, D. M., Kamuz, O. M., Borshch, V. V. (2016)
Ukrainian

English  Optoelectronics and Semiconductor Technique   /     Issue (2016, 51)

Veleshchuk V. P., Vlasenko O. I., Vlasenko Z. K., Khmil D. M., Kamuz O. M., Borshch V. V.
Non-destructive control and diagnostics of led GaN structures by using microplasmas (Review)


Cite:
Veleshchuk, V. P., Vlasenko, O. I., Vlasenko, Z. K., Khmil, D. M., Kamuz, O. M., Borshch, V. V. (2016). Non-destructive control and diagnostics of led GaN structures by using microplasmas (Review). Optoelectronics and Semiconductor Technique, 51, 31-42. http://jnas.nbuv.gov.ua/article/UJRN-0001007744 [In Ukrainian].

 

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