Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods / Drapak, S. I., Gavrylyuk, S. V., Khalavka, Y. B., Fotiy, V. D., Fochuk, P. M., Fediv, O. I. (2022)
web address of the page http://jnas.nbuv.gov.ua/article/UJRN-0001377604
Ukrainian journal of physics   А - 2018 /  Issue (2022, Vol. 67, № 9)
Drapak S. I., Gavrylyuk S. V., Khalavka Y. B., Fotiy V. D., Fochuk P. M., Fediv O. I.
Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods
Cite:
Drapak, S. I., Gavrylyuk, S. V., Khalavka, Y. B., Fotiy, V. D., Fochuk, P. M., Fediv, O. I. (2022). Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods. Ukrainian journal of physics, 67 (9), 671-683. http://jnas.nbuv.gov.ua/article/UJRN-0001377604 | |
|
|
PDF