IR Spectroscopic Study of Thin ZnO Films Grown Using the Atomic Layer Deposition Method / Venger, E. F., Melnichuk, L. Yu., Melnichuk, A. V., Semikina, T. V. (2016)
web address of the page http://jnas.nbuv.gov.ua/article/UJRN-0001396043
Ukrainian journal of physics   А - 2018 /  Issue (2016, Vol. 61, № 12)
Venger E. F., Melnichuk L. Yu., Melnichuk A. V., Semikina T. V.
IR Spectroscopic Study of Thin ZnO Films Grown Using the Atomic Layer Deposition Method
Cite:
Venger, E. F., Melnichuk, L. Yu., Melnichuk, A. V., Semikina, T. V. (2016). IR Spectroscopic Study of Thin ZnO Films Grown Using the Atomic Layer Deposition Method. Ukrainian journal of physics, 61 (12), 1053-1060. http://jnas.nbuv.gov.ua/article/UJRN-0001396043 | |
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