Some aspects of thermal resistance measurement technique for IMPATT and light-emitting diodes / Belyaev A. E., Boltovets N. S., Konakova R. V., Kudryk Ya. Ya., Sorokin V. M., Sheremet V. N., Shynkarenko V. V. (2011)
інтернет-адреса сторінки: http://jnas.nbuv.gov.ua/article/UJRN-0000349832
Semiconductor physics, quantum electronics & optoelectronics    А - 2019 /  Випуск (2011, Vol. 14, № 4)
Belyaev A. E., Boltovets N. S., Konakova R. V., Kudryk Ya. Ya., Sorokin V. M., Sheremet V. N., Shynkarenko V. V.
Some aspects of thermal resistance measurement technique for IMPATT and light-emitting diodes
Cite:
Belyaev, A. E., Boltovets, N. S., Konakova, R. V., Kudryk, Ya. Ya., Sorokin, V. M., Sheremet, V. N., Shynkarenko, V. V. (2011). Some aspects of thermal resistance measurement technique for IMPATT and light-emitting diodes. Semiconductor Physics, Quantum Electronics and Optoelectronics , 14 (4), 465-469. http://jnas.nbuv.gov.ua/article/UJRN-0000349832 | |
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