інтернет-адреса сторінки:
http://jnas.nbuv.gov.ua/article/UJRN-0000741633
Semiconductor physics, quantum electronics & optoelectronics 
А - 2019 /
Випуск (2017, Vol. 20, № 2)
Studenyak I. P., Kutsyk M. M., Bendak A. V., Izai V. Yu., Kus P., Mikula M.
Influence of X-ray irradiation on the optical absorption edge and refractive index dispersion in Cu6PS5I-based thin films deposited using magnetron sputtering
Cite:
Studenyak, I. P., Kutsyk, M. M., Bendak, A. V., Izai, V. Yu., Kus, P., Mikula, M. (2017). Influence of X-ray irradiation on the optical absorption edge and refractive index dispersion in Cu6PS5I-based thin films deposited using magnetron sputtering. Semiconductor Physics, Quantum Electronics and Optoelectronics , 20 (2), 246-249. http://jnas.nbuv.gov.ua/article/UJRN-0000741633
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