Automated method for determining the etch pits density on crystallographic planes of large semiconductor crystals / Pekar, G. S., Singaevsky, A. A., Singaevsky, A. F. (2016)
web address of the page http://jnas.nbuv.gov.ua/article/UJRN-0000714528
Semiconductor Physics, Quantum Electronics and Optoelectronics    А - 2019 /  Issue (2016, Vol. 19, № 1)
Pekar G. S., Singaevsky A. A., Singaevsky A. F.
Аutomated method for determining the etch pits density on crystallographic planes of large semiconductor crystals
Cite:
Pekar, G. S., Singaevsky, A. A., Singaevsky, A. F. (2016). Automated method for determining the etch pits density on crystallographic planes of large semiconductor crystals. Semiconductor Physics, Quantum Electronics and Optoelectronics , 19 (1), 23-27. http://jnas.nbuv.gov.ua/article/UJRN-0000714528 | |
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