Effect of tin on structural transformations in the thin-film silicon suboxide matrix / Voitovych, V. V., Rudenko, R. M., Yukhymchuk, V. O., Voitovych, M. V., Krasko, M. M., Kolosiuk, A. H., Povarchuk, V. Yu., Khatsevych, I. M., Rudenko, M. P. (2016)
Ukrainian

English  Ukrainian Journal of Physics   /     Issue (2016, 61 (11))

Voitovych V. V., Rudenko R. M., Yukhymchuk V. O., Voitovych M. V., Krasko M. M., Kolosiuk A. H., Povarchuk V. Yu., Khatsevych I. M., Rudenko M. P.
Effect of tin on structural transformations in the thin-film silicon suboxide matrix


Cite:
Voitovych, V. V., Rudenko, R. M., Yukhymchuk, V. O., Voitovych, M. V., Krasko, M. M., Kolosiuk, A. H., Povarchuk, V. Yu., Khatsevych, I. M., Rudenko, M. P. (2016). Effect of tin on structural transformations in the thin-film silicon suboxide matrix. Ukrainian Journal of Physics, 61 (11), 986-991. http://jnas.nbuv.gov.ua/article/UJRN-0000732704 [In Ukrainian].

 

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