New Method for Generating Test Codes to Detect Multiple STUCK-AT-FAULTS in Combinational Circuits. Part 1 / Rytsar B. Ye. (2025)
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web address of the page http://jnas.nbuv.gov.ua/article/UJRN-0001588726
  Information technologies and systems   /     Issue (2025, № 2)

Rytsar B. Ye.
New Method for Generating Test Codes to Detect Multiple STUCK-AT-FAULTS in Combinational Circuits. Part 1

Cite:
Rytsar, B. Ye. (2025). Information technologies and systems, 2, 34-54 http://jnas.nbuv.gov.ua/article/UJRN-0001588726

 

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