Electromigration degradation model of metal oxide varistor structures / Ivanchenko, O. V., Tonkoshkur, O. S. (2012)
Ukrainian

English  Ukrainian Journal of Physics   /     Issue (2012, 57 (3))

Ivanchenko O. V., Tonkoshkur O. S.
Electromigration degradation model of metal oxide varistor structures


Cite:
Ivanchenko, O. V., Tonkoshkur, O. S. (2012). Electromigration degradation model of metal oxide varistor structures. Ukrainian Journal of Physics, 57 (3), 331-339. http://jnas.nbuv.gov.ua/article/UJRN-0000724271 [In Ukrainian].

Thickness dependence of refractivity in wall-adjacent epitropic liquid crystal / Popovskii, A. Yu., Mikhailenko, V. I. (2014)
UkrainianEnglish

 

Institute of Information Technologies of VNLU


+38 (044) 525-36-24
Ukraine, 03039, Kyiv, Holosiivskyi Ave, 3, room 209