інтернет-адреса сторінки:
http://jnas.nbuv.gov.ua/article/UJRN-0000714544
Semiconductor physics, quantum electronics & optoelectronics А - 2019 /
Випуск (2016, Vol. 19, № 1)
Ievtukh V. A., Ulyanov V. V., Nazarov A. N.
The charge trapping/emission processes in silicon nanocrystalline nonvolatile memory assisted by electric field and elevated temperatures
Cite:
Ievtukh, V. A., Ulyanov, V. V., Nazarov, A. N. (2016). The charge trapping/emission processes in silicon nanocrystalline nonvolatile memory assisted by electric field and elevated temperatures. Semiconductor Physics, Quantum Electronics and Optoelectronics , 19 (1), 116-123. http://jnas.nbuv.gov.ua/article/UJRN-0000714544