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 Influence of deep-level impurities on the strain electric properties of monocrystalline silicon / Zainabidinov, S., Mamatkarimov, O. O., Khimmatkulov, O., Tursunov, I. G. (2017)
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 web address of the page http://jnas.nbuv.gov.ua/article/UJRN-0000812102 Ukrainian Journal of Physics
    А  - 2018  /      Issue (2017,  Т. 62, № 11) 
 Zainabidinov S., Mamatkarimov O. O., Khimmatkulov O., Tursunov I. G.Influence of deep-level impurities on the strain electric properties of monocrystalline silicon
 
 
 Cite:Zainabidinov, S., Mamatkarimov, O. O., Khimmatkulov, O., Tursunov, I. G. (2017).  Influence of deep-level impurities on the strain electric properties of monocrystalline silicon. Ukrainian Journal of Physics, 62 (11), 951-954. http://jnas.nbuv.gov.ua/article/UJRN-0000812102
 |  | Evaluation of redistribution of hydrogen near a crack-like defect / Stashchuk, M. H. (2016) |  | 
 |  |  Materials Science (Physicochemical mechanics of materials)   /  Issue (2016, 52 (6)) 
 Stashchuk M. H.Evaluation of redistribution of hydrogen near a crack-like defect
 
 Cite:Stashchuk, M. H. (2016). Evaluation of redistribution of hydrogen near a crack-like defect. Materials Science (Physicochemical mechanics of materials), 52 (6), 56-62. http://jnas.nbuv.gov.ua/article/UJRN-0000814119 [In Ukrainian].
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